OpenJournalRank

Proceedings/Proceedings - International Test Conference

Institute of Electrical and Electronics Engineers · United States

ISSN-L
1089-3539
ISSN
2378-2250
OpenAlex ID
S4210209697
APC list price
Not listed
Full statisticsSubscription or hybridCore list

2025: no OJR in this release. Latest calculable OJR: 1.88 in 2009. Last eligible ranking: Q2 in Hardware and Architecture, 2009.

Proceedings/Proceedings - International Test Conference has no quartile in OpenJournalRank’s 2025 ranking. OJR quartiles are calculated independently of SCImago, Scopus and JCR quartiles.